Characterization of wide-band-gap semiconductors %28GaN%2C S…
Characterization of wide-band-gap semiconductors %28GaN%2C SiC%29 by defect-selective etching and complementary methods
Article, Chapter
Authors:
J.L. Weyher
Publication:
Volume:40,
Issue:4-6,
Page(s):279-288
Published:
2006
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