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Characterization of the Si%28 111 %29-Ga interface using opt…
Characterization of the Si%28 111 %29-Ga interface using optical second-harmonic generation
Characterization of the Si%28 111 %29-Ga interface using optical second-harmonic generation
Article, Chapter
Authors: P.V. Kelly
Publication: Journal of Physics: Condensed Matter, Volume:3, Page(s):-S198
Published: IOP Publishing, 1991
ISSN: 0953-8984
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View Full Text Source:Journal of Physics: Condensed Matter,Journal of Physics: Condensed Matter,IOPscience extra Opens in new Window
Journal:  Journal of Physics: Condensed Matter Source:IOPscience extra Opens in new Window
Collection:  IOPscience extra Opens in new Window
Coverage:
  • 1989-01-09~present; volume:1~present;issue:1~present
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